Detalles del libro
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.
Leer más - Autores Peter J. Goodhew, John Humphreys, Richard Beanland
- ISBN13 9781138441538
- ISBN10 1138441538
- Páginas 264
- Año de Edición 2017
- Fecha de publicación 07/07/2017
Reseñas y valoraciones
Electron Microscopy and Analysis
- De
- Peter J. Goodhew, John Humphreys, Richard Beanland
- |
- ROUTLEDGE (2017)
- 9781138441538



